Forensic Science International
Volume 158, Issue 1 , Pages 39-51, 20 April 2006

Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS)

National Institute of Standards and Technology, Surface and Microanalysis Science Division, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD 20899, USA

Received 22 November 2004; received in revised form 17 February 2005; accepted 25 February 2005. published online 08 July 2005.

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PII: S0379-0738(05)00237-9

doi:10.1016/j.forsciint.2005.02.036

Forensic Science International
Volume 158, Issue 1 , Pages 39-51, 20 April 2006

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